Cover image for Quantum Metrology, Imaging, and Communication

Quantum Metrology, Imaging, and Communication

by David S. Simon, Gregg Jaeger, Alexander V. Sergienko

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Science / Physics / Quantum TheoryScience / Physics / Optics & LightTechnology & Engineering / Materials Science / Electronic MaterialsScience / Physics / GeneralTechnology & Engineering / Materials Science / GeneralScience / Physics / Condensed Matter

Description

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Book Details

Publisher:
Springer
Published:
2016-11-02
Pages:
273
Language:
EN
ISBN:
9783319465517