Semiconductor Measurement Technology
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Semiconductor Measurement Technology
Permanent Damage Effects of Nuclear Radiation on the X-band Performance of Silicon Schottky-barrier Microwave Mixer Diodes
Description
No description available
Book Details
- Publisher:
- U.S. Department of Commerce, National Bureau of Standards
- Published:
- 1976
- Pages:
- 26
- Language:
- EN
- ISBN:
- Unknown