Advanced Methods in Automatic Item Generation

by Mark J. Gierl, Hollis Lai, Vasily Tanygin

2021 · Taylor & Francis

Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today’s technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders—from graduate students to scholars to industry professionals—have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.

The Learning Sciences in Educational Assessment

by Jacqueline P. Leighton, Mark J. Gierl

2011 · Cambridge University Press

There is mounting hope in the United States that federal legislation in the form of No Child Left Behind will improve educational outcomes. As titanic as the challenge appears to be, however, the solution could be at our fingertips. This volume identifies visual types of cognitive models in reading, science and mathematics for researchers, test developers, school administrators, policy makers and teachers. In the process of identifying these cognitive models, the book also explores methodological or translation issues to consider as decisions are made about how to generate psychologically informative and psychometrically viable large-scale assessments based on the learning sciences. Initiatives to overhaul educational systems in disrepair may begin with national policies, but the success of these policies will hinge on how well stakeholders begin to rethink what is possible with a keystone of the educational system: large-scale assessment.